John Miller's Homepage

John W. V. Miller

Research Interests: Image Processing, Machine Vision Applications, Optical Metrology

1. Education:

2. Academic Rank: Associate Professor(FT)

3. Degrees, with fields, institutions and dates:

Ph.D. 1983 University of Toledo

MSES 1976 University of Toledo

Engineering Science

MSEE 1971 University of Toledo

Electrical Engineering

BSEE 1968 University of Toledo

Electrical Engineering

4. Number of years service on this faculty: 4 years

5. Other related experience-teaching, industrial, etc.:

1985-1987 Senior scientist responsible for the design and implementation of advanced machine vision systems within Owens-Illinois. Monitor progress in general machine vision area. Developed system for inspecting glass CRT components successfully.

1977-1985 Principal Engineer responsible for the development of machine vision technology suitable for corporate needs. Developed systems which were very effective for the detection of defects in glass containers and was considerably more reliable than human inspection.

1968-1977 Assistant engineer, associate engineer, engineer, principal engineer with increasing responsibilities for testing and improving plasma display panels. Responsibilities included design of low-cost plasma panel drive electronics, panel modeling and design studies, and development of special testing procedures and hardware.

6. Consulting:

The Edison Industrial Systems Center (Toledo, Ohio) for implementation of low-cost systems for industrial automatic inspection applications.

25U. S. patents in the areas of machine vision and plasma panel display devices:

7. States which registered: None

8. Principal publications of last five years:

J. W. V. Miller and M. Shridhar, "Methods for Illumination-Invariant Image Processing," to be published in Advances in Image Processing and Machine Vision, Jorge Sanz, Ed., Springer-Verlag.

B. Shabestari, J. Miller, T. Kohler, and R. Sweney, AC Plasma Panel Barrier Measurements using a Digital Camera, SME Applied Machine Vision '98, May 19-21, Nashville, TN.

J. Haywood, J. W. V. Miller, M. Shridhar, W. Merril and T. Ladewski, "Automated Counting System for the ECE Fragmentation Test", Glass Processing Days, September 13-15, 1997, Tampere, Finland

J. B. Farison, J. W. V. Miller, and X. He, "Additional Properties of the Simultaneous-Diagonalization Transform," International conference on Imaging Science, Systems, and Technology (CISST'97) , June 30-July 3, 1997, Las Vegas, Nevada.

J. W. V. Miller, T. A. Kohler, J. P. Sacha, and B. N. Shabestari, "A system for characterizing small fibers," SPIE Machine Vision Applications, Architectures, and Systems Integration Conference V, Nov. 18-19, 1996, Boston, MA.

J. W. V. Miller, T. A. Kohler, and B. N. Shabestari, "Color AC plasma panel barrier measurement System, SPIE Machine Vision Applications, Architectures, and Systems Integration Conference V, Nov. 18-19, 1996, Boston, MA.

J. W. V. Miller, T. A. Kohler, J. P. Sacha, and B. N. Shabestari, "A system for characterizing small fibers," SPIE Machine Vision Applications, Architectures, and Systems Integration Conference V, Nov. 18-19, 1996, Boston, MA.

J. W. V. Miller, M. Shridhar, and B. N. Shabestari, "Using Gnu C to develop PC-based vision systems," SPIE Machine Vision Applications, Architectures, and Systems Integration Conference IV, Oct. 23-27, 1995, Philadelpha, PA.

J. W. V. Miller, B. N. Shabestari, and R. Sweney, "Determination of geometric stability of glass substrates using vision," SPIE Machine Vision Applications, Architectures, and Systems Integration Conference IV, Oct. 23-27, 1995, Philadelpha, PA

M. E. Shields, J. B. Farison and J. W V. V. Miller, "SD Filtering for Enhancement of a Nuclear Medicine Image Sequence," Proceedings of the 32 Annual Rocky Mountain Bioengineering Symposium and 32 International ISA Biomedical Sciences Instrumentation symposium, April 7-9, 1995, Copper Mountain, CO.

Patents

3,786,474 3,798,501 3,806,761 3,887,767 3,938,133 3,993,990

4,045,790 4,063,131 4,087,805 4,101,810 4,128,901 4,130,779

4,140,944 4,200,822 4,215,939 4,378,494 4,378,495 4,385,318

4,409,012 4,432,013 4,467,350 4,579,227 4,760,270 4,820,932

4,941,191

9. Scientific and professional societies of which a member:

IEEE (Pace chairman for Toledo Section)

10. Honors and awards:

Tau Beta Pi, Eta Kappa Nu, Sigma Xi,

Supplemental Patent Award, from Owens-Illinois Inc., 1984.

11. Subjects or courses taught this year by terms:

Course Title Term Lec Lab Type

ECE 588 Applied Machine Vision Fall 97 3 Eve

ECE 311 Electronics Circuits I Fall 97 3 1 Day

ECE 274 Computer Methods in EE II Fall 97 3 Day

ECE 311 Electronics Circuits I Winter 98 3 1 Day

ECE 270 Computer Methods in EE I Winter 98 2 Day

ECE 270 Comp Methods in EE Summer 98 2 Day

ECE 311 Electronic Circuits I Summer 98 3 Day

12. Other assigned duties performed during academic year:

School of Engineering Faculty Secretary

ECE Curriculum Committee

ECE Graduate Committee